Semiconductor Electrical Characteristics Testing SMU Unit S100 DC 30V 1A SMU Measurement
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:Semiconductor Electrical Characteristics Testing SMU Unit, DC S100 SMU Unit, S100 30V 1A SMU Measurement
Semiconductor Electrical Characteristics Testing SMU Unit S100 DC 30V 1A SMU Measurement The S100 Source Measure Unit, meticulously crafted by PRECISE INSTRUMENT, is an outstanding representative of domestic testing equipment. It breaks the long-standing monopoly of foreign technology and delivers a... View More
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30V 30A Dual Channel Source Meter Unit DP100B With Voltage / Current Measurement
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:30V 30A Dual Channel Source Meter, DP100B Source Meter Unit, Voltage Current SMU unit
30V 30A Dual Channel Source Meter Unit DP100B With Voltage / Current Measurement The DP100B dual channel high precision desktop pulse source measure unit is the newly developed high precision, large dynamic, digital touch source measure unit that based on the single channel pulse desktop source meas... View More
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3 Slots Sub Card Plug In SMU Unit 1003C Source Measurement Unit
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:Sub Card Plug In SMU Unit, 3 Slots SMU Unit, 1003C Source Measurement Unit
3 Slots Sub Card Plug In SMU Unit 1003C Source Measurement Unit The 1003C modular chassis is a professional-grade testing solution engineered for high-performance applications. Combining modular scalability with industrial-grade reliability, it serves as a critical testing infrastructure in scientif... View More
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300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:300A 30V Pulse Power Supply, 300A 30V High Current Source, HEMT Test Pulse Power Supply
300A 30V Pulse Power Supply High Current Source HCPL030 For SiC IGBT GaN HEMT Test The HCPL030 series high - current pulse power supply is a pulse constant - current source. The product features steep output pulse edges (10μs), high testing efficiency (40ms, with external control relay), support for... View More
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1200V 100mA High Voltage Power Source Measure Unit For IGBT Breakdown Voltage Test
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:High Voltage Power Source Measure Unit, 1200V 100mA High Voltage Power Source, IGBT Breakdown High Voltage Power Source
1200V/100mA High Voltage Power Source for IGBT Breakdown Voltage Test The E100 is a high-performance high voltage source measure unit specifically designed for high voltage testing environments. It can output and measure voltages up to 1200V, and accurately measure weak current signals as low as 1nA... View More
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60A CW / 600A QCW Testing Laser Power Supply HCPL060 Diode Laser Power Supply
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:600A QCW Testing Laser Power Supply, 60A CW Testing Laser Power Supply, HCPL060 Diode Laser Power Supply
60A CW / 600A QCW Testing Laser Power Supply HCPL060 Diode Laser Power Supply HCPL060 is a high-performance optoelectronic device test power supply that integrates advanced power electronics technology and intelligent control algorithms. It has two working modes, CW and QCW, and can output pulse and... View More
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1MS/S A400 Data Acquisition Card 4 Channels 16 Bit ADC Resolution Daq Card
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:A400 Data Acquisition Card, 16 Bit ADC Resolution Daq Card, 4 Channels Data Acquisition Card
1MS/S A400 Data Acquisition Card 4 Channels 16 Bit ADC Resolution Daq Card A400 data acquisition card is a plug-in card type independently designed and developed by Psysi, which supports variable rate sampling and large-capacity data storage, with 4 channels in a single card and up to 40 channels in... View More
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LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System
Price: Negotiable
MOQ: 1 unit
Delivery Time: 2-8 weeks
Brand: PRECISE INSTRUMENT
High Light:Laser Aging Semiconductor Test Systems, LDBI Semiconductor Test Systems, Multi Channel Power Device Analyzer
LDBI Laser Aging Semiconductor Test Systems Multi Channel Testing System LDBI multi-channel high-power laser aging system is specifically designed to address the issues of kilowatt-level high-power semiconductor laser chips and pump laser modules that require narrow pulse high current testing and ag... View More
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